products > VERTICAL PROBE CARD
STAr has developed a proprietary patented vertical probe card design that is tunable for wide varieties of parametric, mixed signal, memory IC and logic IC applications.
- PARAMETRIC VERTICAL PROBE CARD
- MIXED-SIGNAL VERTICAL PROBE CARD
- SOC IC VERTICAL PROBE CARD
PARAMETRIC VERTICAL PROBE CARD
Virgo PRO-Zenith - Parametric and Reliability Vertcial Probe Cards
STAr Virgo PRO-Zenith probe cards are highly suitable for ultra-low leakage current test at extreme thermal environment while having contact resistance of <0.3 Ω.
MIXED-SIGNAL VERTICAL PROBE CARD
Aries-Zenith - Mixed Signal IC Test Probe Cards
STAr Aries-Zenith probe card enables mixed-signal/analog Ics and accurate high-current low-voltage Kelvin-type probing of bumped pads for multi-DUT PMIs power management ICs (PMIs) functional tests.
SOC IC VERTICAL PROBE CARD
Aries Gamma-C - Verigy 93K Direct Dock Probe Card
Aries Zenith-BI - SOC/Memory IC Burn-In Probe Cards
Aries Zenith-BI - SOC/Memory IC Burn-In Probe Cards
STAr Aries Gamma-C (vertical “Cobra”) probe card enables high-performance, multi-site functional test at wafer sort and is mechanically engineered for contact force management and with the planarity to support for high pin counts at wafer test.
Aries Zenith-BI - SOC/Memory IC Burn-In Probe Cards
Aries Zenith-BI - SOC/Memory IC Burn-In Probe Cards
Aries Zenith-BI - SOC/Memory IC Burn-In Probe Cards
STAr Aries Zenith-BI is vertical contact probe card technologies applicable specifically for high temperature burn-in of SOC and memory ICs and highly suitable for wafer sort and functional test of small pad advanced power devices tests.