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www.STAr-Quest.com
  • 思達科技 | STAR TECHNOLOGIES
  • ABOUT US
    • COMPANY PROFILE
    • PHILOSOPHY
    • MILESTONE
    • MANAGEMENT
    • QUALITY POLICY
    • CSR POLICY
  • PRODUCTS
    • PARAMETRIC INSTRUMENT
    • RELIABILITY TEST SYSTEM
    • AUTOMATED TEST EQUIPMENT
    • YIELD ENHANCEMENT
    • METROLOGY TOOL
    • PARAMETRIC PROBE CARD
    • FUNCTIONAL PROBE CARD
    • VERTICAL PROBE CARD
    • MEMS PROBE CARD
    • CONDUCTIVE ELASTOMER
    • PROBE STATION
    • PROFESSIONAL SERVICE
  • SOLUTIONS
    • PARAMETRIC TEST
    • RELIABILITY TEST
    • IC AUTOMATED TEST
    • RF & WIRESLESS TEST
    • PHOTONICS &OPTRONIC TEST
    • POWER ELECRONICS TEST
    • FPD & LED TEST
  • NEWS & EVENTS
    • NEWS
    • - ARCHIEVE 2024
    • - ARCHIEVE 2023
    • - ARCHIEVE 2022
    • - ARCHIEVE 2021
    • EVENTS
  • CONTACT US
    • GROUP COMPANY
    • GLOBAL SALES NETWORK
  • PARTNERS
    • BUSINESS PARTNERS
    • SOLUTION PARTNERS
    • INDUSTRY PARTNERS

SOLUTIONS > PHOTONICS & OPTRONIC TEST SOLUTIONS

PHOTONICS & OPTRONIC TEST SOLUTIONS

The silicon photonics and optronics market is growing fast in data centers, and more applications are looming on the horizon. STAr has over 20 years of integration test system experience and is able to design and manufacture test solutions to meet customer requirements for R&D, engineering, high-volume production, and reliability qualification.

Sagittarius-SPT - Silicon Photonics Test System

Sagittarius-SPT - Silicon Photonics Test System

STAr Sagittarius-SPT is an electro-optics/silicon-photonics wafer-level test solutions for characterization and acceptance tests of silicon-photonics devices.


Characterization/Technology Development

•Electrical Characterization:

 Ion, Ioff, Von, Capacitance, Resistance,dielectric constants, leakages, power, etc.

•Optical Characterization:

 Insertion Loss, Coupling Efficiency, Transmissivity, PD responsivity, Polarization, etc.

•Electro-Optic Characterization : 

 O-I and I-O efficiency, bandwidths

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