STAr Sagittarius-SPT is an electro-optics/silicon-photonics wafer-level test solutions for characterization and acceptance tests of silicon-photonics devices.
Characterization/Technology Development
•Electrical Characterization:
Ion, Ioff, Von, Capacitance, Resistance,dielectric constants, leakages, power, etc.
•Optical Characterization:
Insertion Loss, Coupling Efficiency, Transmissivity, PD responsivity, Polarization, etc.
•Electro-Optic Characterization :
O-I and I-O efficiency, bandwidths
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