PRODUCTS > RELIABILITY TEST SYSTEM
STAr uses its extensive industry expertise to design, build, test and support reliability systems for semiconductor devices and interconnects reliability life test, IC product burn-in, environmental test, product screening, PCB reliability test, etc. to fulfill all the needs to build a solid reliability engineering system.
- ALL-IN-ONE RELIABILITY TESTER
- ADVANCED DEVICE RELIABILITY
- ADVANCED INTERCONNECT RELIABILITY
- POWER DEVICE RELIABILITY
- RELIABILITY TEST & ANALYSIS SOFTWARE
- AUTOMATED ACCELERATED RF RELIABILITY TEST SYSTEM
ALL-IN-ONE RELIABILITY TESTER
Pluto - All-in-One Per-Pin SMU Reliability Test System
Pluto - All-in-One Per-Pin SMU Reliability Test System
Pluto - All-in-One Per-Pin SMU Reliability Test System
STAr Pluto series tester is an advanced all-in-one testers for both package- and wafer-level tests and covers all reliability requirements such as HCI, BTI, OTF, TDDB and EM, etc.
Gemini – All-in-one Reliability Tester
Pluto - All-in-One Per-Pin SMU Reliability Test System
Pluto - All-in-One Per-Pin SMU Reliability Test System
STAr Gemini Series is an all-in-one reliability tester for HCI, BTI, TDDB, stress induced leakage current (SILC), electromigration and stress migration, etc.
ADVANCED DEVICE RELIABILITY tester
Scorpio ART – HCI/BTI Package-Level Reliability Tester
Scorpio ART – HCI/BTI Package-Level Reliability Tester
Scorpio ART – HCI/BTI Package-Level Reliability Tester
STAr Scorpio HCI/BTI Package Level Reliability Tester is equipped with JEDEC compliant test requirements for advance and accurate MOSFET HCI, NBTI and OTF reliability qualifications.
Scorpio ART – HCI/BTI Wafer-Level Reliability Tester
Scorpio ART – HCI/BTI Package-Level Reliability Tester
Scorpio ART – HCI/BTI Package-Level Reliability Tester
STAr Scorpio HCI/BTI Wafer Level Reliability Tester is equipped with JEDEC compliant test requirements for advance and accurate MOSFET HCI, NBTI and OTF reliability qualifications.
Scorpio ART – GOI/TDDB Package-Level Reliability Tester
Scorpio ART – GOI/TDDB Package-Level Reliability Tester
Scorpio ART – GOI/TDDB Package-Level Reliability Tester
STAr Scorpio GOI/TDDB Package Level Reliability Tester provides JEDEC compliant test needs for advance oxide reliability analysis. VTDDB, VSILC and D/G Stress analysis for both MOSFET and capacitors.
Scorpio ART – GOI/TDDB Wafer-Level Reliability Tester
Scorpio ART – GOI/TDDB Package-Level Reliability Tester
Scorpio ART – GOI/TDDB Package-Level Reliability Tester
STAr Scorpio GOI/TDDB Reliability Tester provides JEDEC compliant test needs for advance oxide reliability analysis.
ADVANCED INTERCONNECT RELIABILITY TESTER
Scorpio AIR-DCEM – Advanced Package-Level Electromigration Tester
Scorpio AIR-DCEM – Advanced Package-Level Electromigration Tester
Scorpio AIR-DCEM – Advanced Package-Level Electromigration Tester
STAr Scorpio AIR-DCEM Package Level Tester supports reliability qualification of nanometer nodes Cu/Low-K interconnect process.
Scorpio AIR-DCEM – Advanced Wafer-Level Electromigration Tester
Scorpio AIR-DCEM – Advanced Package-Level Electromigration Tester
Scorpio AIR-DCEM – Advanced Package-Level Electromigration Tester
STAr Scorpio AIR-DCEM Wafer Level Reliability Tester supports qualification of nanometer nodes Cu/Low-K interconnect process.
Scorpio AIR-DAEM – Dynamic High-Current AC EM / IMD-TDDB Tester
Scorpio AIR-DCEM – Advanced Package-Level Electromigration Tester
Scorpio AIR-DAEM – Dynamic High-Current AC EM / IMD-TDDB Tester
STAr Scorpio AIR-DAEM Reliability Tester supports IMD-TDDB tests for 3D-ICs silicon interposer, TSV and micro-bumps.
POWER DEVICE RELIABILITY
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
STAr Scorpio hiVIP HCE/HTRB/HTGB Reliability Tester covers the reliability requirements for high power devices with voltage requirements up to +200 V.
Scorpio hiVIP – Vt-Stability Reliability Tester
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
STAr Scorpio hiVIP – Vt Stability Reliability Tester is designed for Vt Stability analysis with different stress and temperature profiles in conformance to the industrial needs for high power devices.
Scorpio hiVIP – GOI/TDDB Reliability Tester
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
Scorpio hiVIP – GOI/TDDB Reliability Tester
STAr Scorpio hiVIP – GOI/TDDB Reliability Tester provides GOI/TDDB test capabilities for high power MOSFET and capacitors.
RELIABILITY TEST & ANALYSIS SOFTWARE
Sagittarius WLR – Wafer-Level Reliability
Sagittarius WLR – Wafer-Level Reliability
Sagittarius WLR – Wafer-Level Reliability
STAr Sagittarius WLR reliability comprises of the industry de-facto standard parametric integrated software with full suite of WLR test algorithms for EM, HCI, BTI, TDDB, etc. Special applications for multi-die WLR for enhanced throughput are also available.
Aquarius RDA – Reliability Data Analyzer
Sagittarius WLR – Wafer-Level Reliability
Sagittarius WLR – Wafer-Level Reliability
Aquarius RDA provides dynamic data analysis and graphical interpretation of reliability results for immediate analysis and reporting and available for HCI/BTI, GOI/TDDB, Vt Stability and EM applications.
Sandia Technologies PDQ-WLR
Sagittarius WLR – Wafer-Level Reliability
Sandia Technologies PDQ-WLR
Sandia Technologies PDQ-WLR wafer-level reliability test software supports production and development reducing cost-of-tests.
AUTOMATED ACCELERATED RF RELIABILITY TEST SYSTEM
DC-AARTS Automated Accelerated Reliability Test System
mmWave-AARTS Automated Accelerated Reliability Test System
DC-AARTS Automated Accelerated Reliability Test System
STAr DC AARTS (Automated Accelerated Reliability Test Station) systems are designed to maximize channel density and integrated all the functions required for reliability parametrization testing such as GaN/GaAs gallium arsenide semiconductor RF devices.
RF-AARTS Automated Accelerated Reliability Test System
mmWave-AARTS Automated Accelerated Reliability Test System
DC-AARTS Automated Accelerated Reliability Test System
STAr RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus in order to evaluate reliability and performance degradation.
mmWave-AARTS Automated Accelerated Reliability Test System
mmWave-AARTS Automated Accelerated Reliability Test System
mmWave-AARTS Automated Accelerated Reliability Test System
STAr mmWave AARTS systems are designed to characterize the reliability of high frequency devices at their intended end-use operating conditions.
Standard RF Fixture
Quantum SMART RF/Microwave Test Fixtures
mmWave-AARTS Automated Accelerated Reliability Test System
Accel-RF standard RF fixture supports both pulsed and non-pulsed operation and employs SMA input/output connections. For RF output powers over 10W, an N-type connector may be used to replaces the SMA connector because of its power-handling capability.
Quantum SMART RF/Microwave Test Fixtures
Quantum SMART RF/Microwave Test Fixtures
Quantum SMART RF/Microwave Test Fixtures
Accel-RF Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture.
Small Footprint RF-Ready DC Fixture
Quantum SMART RF/Microwave Test Fixtures
Quantum SMART RF/Microwave Test Fixtures
Accel-RF Small Footprint RF-Ready DC Fixture has been the industry standard for DC life testing for over a decade and comes standard with SMA input/output connectors for RF characterization.