PRODUCTS > RELIABILITY TEST SYSTEM

STAr Scorpio AIR-DCEM Package Level Reliability Tester supports reliability qualification of nanometer nodes Cu/Low-K interconnect process and support parallel test up to 384 DUTs.

STAr Scorpio AIR-DCEM Wafer Level Reliability Tester supports qualification of nanometer nodes Cu/Low-K interconnect process and enables high performance 1uA to 100mA copper interconnect electromigration test and up to 100V low-K IMD-TDDB qualification.

STAr Scorpio AIR-DAEM Reliability Tester supports IMD-TDDB tests for 3D-ICs silicon interposer, TSV and micro-bumps and enables parallel constant high current EM tests up to 5A-dc with up and TDDB up to 200V. 

STAr Scorpio HiViP HCE/HTRB/HTGB Reliability Tester is designed to support precise low and high voltage stress bias and covers the reliability requirements for high power devices such as DMOS, IGBT and power MOSFETs. 

STAr Scorpio hiVIP – Vt Stability Reliability Tester is designed for package level test and supports Vt Stability analysis with different stress and temperature profiles in conformance to the industrial needs for high power devices.

STAr Scorpio hiVIP – GOI/TDDB Reliability Tester is designed to support high power MOSFET and capacitors qualification for package level reliability tests. With the direct-docking of DUT boards, the system ensures accurate data and enables multiple experiments to be performed in one system at any one time.

STAr Sagittarius WLR reliability comprises of the industry de-facto standard parametric integrated software with full suite of WLR test algorithms for EM, HCI, BTI, TDDB, etc. Special applications for multi-die WLR for enhanced throughput are also available.

Aquarius RDA provides dynamic data analysis and graphical interpretation of reliability results for immediate analysis and reporting and available for HCI/BTI, GOI/TDDB, Vt Stability and EM applications.

Sandia Technologies PDQ-WLR wafer-level reliability test software supports production and development reducing cost-of-tests. 

STAr DC AARTS (Automated Accelerated Reliability Test Station) systems are designed to maximize channel density and integrated all the functions required for reliability parametrization testing such as GaN/GaAs gallium arsenide semiconductor RF devices.

STAr RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus in order to evaluate reliability and performance degradation. 

STAr mmWave AARTS systems are designed to characterize the reliability of high frequency devices at their intended end-use operating conditions.

Accel-RF standard RF fixture supports both pulsed and non-pulsed operation and employs SMA input/output connections. For RF output powers over 10W, an N-type connector may be used to replaces the SMA connector because of its power-handling capability.

Accel-RF Quantum SMART Fixture is a programmable self-contained DC bias and RF stimulus control module capable of synchronizing sequenced independent pulsed-bias and pulsed-RF signals to a DUT or remote fixture.

Accel-RF Small Footprint RF-Ready DC Fixture has been the industry standard for DC life testing for over a decade and comes standard with SMA input/output connectors for RF characterization.