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www.STAr-Quest.com
  • 思達科技 | STAR TECHNOLOGIES
  • ABOUT US
    • COMPANY PROFILE
    • PHILOSOPHY
    • MILESTONE
    • MANAGEMENT
    • QUALITY POLICY
    • CSR POLICY
  • PRODUCTS
    • PARAMETRIC INSTRUMENT
    • RELIABILITY TEST SYSTEM
    • AUTOMATED TEST EQUIPMENT
    • YIELD ENHANCEMENT
    • METROLOGY TOOL
    • PARAMETRIC PROBE CARD
    • FUNCTIONAL PROBE CARD
    • VERTICAL PROBE CARD
    • MEMS PROBE CARD
    • CONDUCTIVE ELASTOMER
    • PROBE STATION
    • PROFESSIONAL SERVICE
  • SOLUTIONS
    • PARAMETRIC TEST
    • RELIABILITY TEST
    • IC AUTOMATED TEST
    • RF & WIRESLESS TEST
    • PHOTONICS &OPTRONIC TEST
    • POWER ELECRONICS TEST
    • FPD & LED TEST
  • NEWS & EVENTS
    • NEWS
    • - ARCHIEVE 2024
    • - ARCHIEVE 2023
    • - ARCHIEVE 2022
    • - ARCHIEVE 2021
    • EVENTS
  • CONTACT US
    • GROUP COMPANY
    • GLOBAL SALES NETWORK
  • PARTNERS
    • BUSINESS PARTNERS
    • SOLUTION PARTNERS
    • INDUSTRY PARTNERS

SOLUTIONS > FPD & LED TEST SOLUTIONS

FPD & LED TEST SOLUTIONS

In the manufacturing process of FPD and LED, inspection and testing are required to assure production yield. STAr launches advanced integrated test system which is the efficient test solution to industry customers.

Unicorn LAIT II - Advanced Mini- and Micro- LED Tester

STAr Unicorn-LAIT II is an advanced high throughput LED test system. The system provides critical measurements for Mini- and Micro- LEDs and integrates parallel test instrument, probe station and probe cards in one system, and offers a comprehensive analysis result to industry users.


Features

High-Throughput Parallel Test System

•Module based LPX instrument with 48 channels per module and up to five modules.

•High precision multi-ranging voltage and current parametric measurement units (PMU).

•High-speed parallel tests based on FPGA firmware control and high-speed ADC.


High-Precision LED Probe Station

•High-precision closed-loop XYZ stages ensuring best accuracy in multi-LED stepping.

•High-resolution patented coaxial scanning and probing microscopes.

•Porous ceramic chuck with patent pending auxiliary chucks for cleaning and contact check.


Multi-DUT LED Test Probe Card

•Stable long lifetime multi-DUT LED test probe cards with low maintenance requirements.

•Wide varying probe layout configurations (1xN, MxN, etc.) for accurate multi-DUT probing.

•Integrated patent pending CDA blowing system to clear off probe debris.

Flexible and User-Friendly Software

•Easy product definition with automatic wafer and probe card alignment.

•Multi-language and intuitive operation interface.

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