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www.STAr-Quest.com
  • 思達科技 | STAR TECHNOLOGIES
  • ABOUT US
    • COMPANY PROFILE
    • PHILOSOPHY
    • MILESTONE
    • MANAGEMENT
    • QUALITY POLICY
    • CSR POLICY
  • PRODUCTS
    • PARAMETRIC INSTRUMENT
    • RELIABILITY TEST SYSTEM
    • AUTOMATED TEST EQUIPMENT
    • YIELD ENHANCEMENT
    • METROLOGY TOOL
    • PARAMETRIC PROBE CARD
    • FUNCTIONAL PROBE CARD
    • VERTICAL PROBE CARD
    • MEMS PROBE CARD
    • CONDUCTIVE ELASTOMER
    • PROBE STATION
    • PROFESSIONAL SERVICE
  • SOLUTIONS
    • PARAMETRIC TEST
    • RELIABILITY TEST
    • IC AUTOMATED TEST
    • RF & WIRESLESS TEST
    • PHOTONICS &OPTRONIC TEST
    • POWER ELECRONICS TEST
    • FPD & LED TEST
  • NEWS & EVENTS
    • NEWS
    • - ARCHIEVE 2024
    • - ARCHIEVE 2023
    • - ARCHIEVE 2022
    • - ARCHIEVE 2021
    • EVENTS
  • CONTACT US
    • GROUP COMPANY
    • GLOBAL SALES NETWORK
  • PARTNERS
    • BUSINESS PARTNERS
    • SOLUTION PARTNERS
    • INDUSTRY PARTNERS

products > MEMS PROBE CARD

MEMS PROBE CARD

STAr has designed and developed MEMS (Micro-Electro-Mechanical Systems) type micro-Cantilever probe card suitable for testing of highly parallel large-array multi-DUT devices to increase productivity with greatly reduce cost-of-test.

Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card

Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card

Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card

Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card

STAr Virgo-Prima is 3D/2.5D MEMS micro-cantilever probe card and specifically designed and delivered for nanometer technology node process and is an ideal integrated probe card solution for End-of-Line WAT/E-Test, In-line/process Parametric/E-test and reliability tests including HCI, TDDB, EM, etc.

Aries-Prima One-Touch Memory Test Probe Card

Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card

Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card

Aries-Prima One-Touch Memory Test Probe Card

STAr Aries-Prima 3D MEMS probe card supports highly parallel large array multi-DUT memory test and enables one touch-down contact for the whole 300mm wafer testing.

Aries-Optima MEMS Vertical Probe Card

Aries-Optima MEMS Vertical Probe Card

Aries-Optima MEMS Vertical Probe Card

Aries-Optima MEMS Vertical Probe Card

STAr Aries-Optima probe card is the high-current MEMS vertical probe card for high-volume manufacturing and manufacturing and the latest pinnacle of MEMS probe card technology to address the test needles in wafer-level testing.

Aries-Optima MEMS Vertical Probe Card

Aries-Optima MEMS Vertical Probe Card

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