products > MEMS PROBE CARD
STAr has designed and developed MEMS (Micro-Electro-Mechanical Systems) type micro-Cantilever probe card suitable for testing of highly parallel large-array multi-DUT devices to increase productivity with greatly reduce cost-of-test.
Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card
Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card
Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card
STAr Virgo-Prima is 3D/2.5D MEMS micro-cantilever probe card, and specifically designed and delivered for nanometer technology node process and is an ideal integrated probe card solution for End-of-Line WAT/E-Test, In-line/process Parametric/E-test and reliability tests including HCI, TDDB, EM, etc.
Aries-Prima One-Touch Memory Test Probe Card
Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card
Virgo-Prima 3D/2.5D MEMS Micro-Cantilever Probe Card
STAr Aries-Prima 3D MEMS memory test probe card supports highly parallel large array multi-DUT Memory test and is only one touch-down contact required for the whole 300mm wafer testing.
Aries-Optima MEMS Vertical Probe Card
Aries-Optima MEMS Vertical Probe Card
Aries-Optima MEMS Vertical Probe Card
STAr Aries-Optima probe card is the world’s first fine-pitch high-current MEMS vertical probe card for high-volume manufacturing and the latest pinnacle of MEMS probe card technology, setting new standards, addressing emerging needs in wafer-level testing.
Aries-Optima MEMS Vertical Probe Card
Aries-Optima MEMS Vertical Probe Card