NEWS & events > NEWS > Archieve 2023

STAr All-in-One Per-pin SMU Reliability Test System to be Presented at MBE Booth During the 34th ESREF Exhibition

Collaboration between STAr Technologies and MBE to Strengthen Marketing Strategy on Reliability Test Solution in EU Market

To strengthen the regional marketing strategy, STAr Technologies, a semiconductor reliability test system supplier and MB Electronics, a renowned trading company expert in test system and services, begin the strategic cooperation on reliability test solutions in 2023, to correspond to the steady growth of discrete devices volume and to address the devices test needs of characteristics qualification in EU market.

ESREF, the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, is an international symposium focuses on recent developments and future direction in quality and reliability management of materials, devices, optoelectronics, etc. At the 34th ESREF exhibition this year, STAr will present Pluto all-in-one per pin SMU reliability test system to the audiences at MBE's Booth No. 12. Equipped with micro-oven which controlled temperature ≤35 ~ 350degC, the test solution supports both PLR/WLR test and a complete set of application including HCI/OTF/HCE, GOI/TDD and EM, etc. and efficiently enhance measurement accuracy to meet engineering and production requirements.

"We are pleased to participate in ESREF exhibition and present our product at MBE's booth. Our expertise in semiconductor reliability testing is based on decades of experience. With cooperation between MBE and STAr, we provide clients in EU market another PLR/WLR reliability test solution and service in characteristic qualification." said Dr. Choon-Leong Lou, CEO of STAr Technologies.

The 34th ESREF will take place at Diagora Congress Center in Toulouse, France from October 2 to 5, 2023. For more event information, please refer to ESREF website at https://esref2023.sciencesconf.org/.

STAr Technologies and Korea Conformity Laboratories Sign MoU for Semiconductor Reliability Test

STAr Technologies, Inc. ("STAr" for short), a well-known semiconductor test solutions supplier, and Korea Conformity Laboratories ("KCL" for short), a leading testing and certification organization, today announced signing a memorandum of understanding (MoU) for a strategic cooperation on reliability test solutions to address the growing needs for discrete semiconductor devices characteristics and qualification test.

Discrete semiconductors also in words such as "power devices" or "power semiconductors", are designed to reduce power loss in high-voltage and high-current application. To cope with the requirements of "miniaturization" and "energy-saving", demands for high performance devices increases. In high-volume production, a more efficient, cost-effective qualification test with reliable result and accelerate time to market become a key issue to manufactures.

STAr is experienced at semiconductor device characteristic test for decades and continuously develops advanced reliability test technology and provides efficient solutions to semiconductor manufacturer. KCL, as the test, inspection, and certification organization, provides professional consulting and services to industry companies. The collaboration between STAr and KCL will lead the achievement in research and development and enterprises expansion Korea market.

Min-Jung Cho, Director of Korea Conformity Laboratories said, "KCL is renowned for professional qualification test services. With the rapid growth of new application markets and the associated needs involved more ranges, the development of semiconductor devices must continue to advance and innovate. The MoU is a marketing strategy and will enhance our technology in device characteristics test. We do look forward to collaborating with STAr and providing more complete services to customers."

Byong-Sun Choi, General Manager of STAr Technologies Korea adds, "It is glad to announce the agreement with KCL today. We now have a good partner to accomplish competitive semiconductor reliability test solution for high-performance devices qualification. We are also confident of the collaboration will result in optimized architecture, more competitive products and services. Looking forward to writing a new chapter in devices qualification with KCL in the future."

Congratulations! Winning Most Inspirational Presentation Award at 2023 SWTest

Congratulation to Dr. Choon-Leong Lou, CEO & CTO of STAr Technologies, Inc., won the "Most Inspirational Presentation Award" at 2023 SWTest for his presentation titled "MEMS Probe Cards for Advanced High-Volume Inline Process Control Monitoring (PCM) and End-of-Line Wafer-Acceptance Tests (WAT)".

Dr. Choon-Leong Lou serves as CEO at STAr Technologies and is recognized for his technology knowledge on semiconductor integrated test systems and test probe cards on WAT and functional test. He has ever led STAr R&D team to successfully develop the world first fine-pitch high-current MEMS vertical probe card in 2021. Continuously focuses on MEMS probe application, STAr launched 3D/2.5D MEMS Micro-Cantilever probe card for WAT test which is an innovation to MEMS probe technology development and surpasses most probe card manufacturers this year.

"It is great honor to me. I am glad to receive the presentation award at SWTest 2023 and thank GlobalFoundries Singapore for their contributions and our team’s great support. Looking forward to introducing these advanced MEMS probe card and these new MEMS probe cards technologies to inline PCM and end-of-line WAT for all our supporters," said Dr. Choon-Leong Lou.

STAr Technologies Will Present Component Test Solutions at IEEE The Electronic Components and Technology Conference

STAr Technologies, a well-known semiconductor test system and probe card supplier, will participate in the expo at IEEE ECTC for the first time. ECTC is a premier technical conference in the industry and focuses on the cutting-edge applications such as packaging, components, and microelectronic system technology, etc. The 73rd ECTC will be held in Orlando, Florida, USA from May 30 to June 2, and attracts various domestics and foreign companies and manufactures to attend this great event.

At the expo, STAr will introduce the advanced component test solutions to industry customers, including Mercury Series, the mixed signal ATE and semi-/full- automated test probe stations which enable to improve test efficiency and ensure product qualification and reliability. Furthermore, Aries Optima MEMS probe card, which is designed to meet the needs of high-current test and ideal for RF, AP, and high-power test attributed to its stable DC performance with great leakage performance.

For the first participation in IEEE ECTC, Dr. Choon-Leong Lou, CEO of STAr Technologies says, “With the process shrink of semiconductor, ICs and components, customers' requirement for the accuracy of package-level test also gradually increases. STAr's component test solutions are integrated and highly flexible configurations to support parametric, reliability and functional test, etc. It is expected that there will be more industry customers know the efforts that we have put into test technology developments and our achievements.”

IEEE ECTC event Information is as follows:

Date: May 30 to June 2, 2023

Venue: JW MARRIOTT Orlando Grande Lakes, Orlando, FL

Website: https://www.ectc.net/

Award Ceremony for "A STAr is Born" Primary School Students in 2022 Academic Year

 On the morning of January 18, the award ceremony for "A STAr is Born" Annual Bursary was held in Gran Royal Hotel, Toufen City, Miaoli County. Miaoli Country Magistrate Mr. Tung-Chin Chung, Director of Education Ministry Ms. Shin-Hui Yean and STAr Technologies’ Chairman Dr. Choon-Leong Lou were in attendance. Primary school students awarded the "A STAr is Born" bursaries interacted and shared with school lift with the sponsor, Dr. Choon-Lou onsite with warm atmosphere. 

"A STAr is Born" is a long-term bursaries and scholarships program launched by Dr. Choon-Leong Lou, Chairman of STAr Technologies, a well-known supplier of semiconductor test system and probe card provided, to encourage students moving toward and to be better. To give back to society and to cultivate talents, with the official launch in 2022 academic year, STAr Technologies will annually sponsor monthly bursaries and semester scholarship to all 119 primary schools (including branches) in Miao County. The Annual "A STAr is Born" Award Ceremony will also be held to congratulate the students receiving the bursaries and scholarships. In addition, to understand their leaning situations while encouraging them to keep moving.

"I am very happy to meet the students joining this program and receive the most direct feedback to the "A STAr is Born" program. I believe that every child has their own talent. The only way to establish good foundation of knowledge, to carve out their successful future is the carefree schooling. This is exactly the goal set for the A STAr is Born Program", said Dr. Choon-Leong Lou, Chairman of STAr Technologies.

Miaoli Country Magistrate Mr. Tung-Chin Chung expressed his gratitude to Dr. Lou who focuses on primary education. This program does timely support primary school students in Miaoli and inspire them to surpass themselves and enhance their ability. Mr. Chung also encouraged the students attending the ceremony to keep STAr Technologies’ kindness in mind and diligently continuous learning to become outstanding talents in the future.