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    • FUNCTIONAL PROBE CARD
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    • MEMS PROBE CARD
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    • PROBE STATION
    • PROFESSIONAL SERVICE
  • SOLUTIONS
    • PARAMETRIC TEST
    • RELIABILITY TEST
    • IC AUTOMATED TEST
    • RF & WIRESLESS TEST
    • PHOTONICS &OPTRONIC TEST
    • POWER ELECRONICS TEST
    • FPD & LED TEST
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www.STAr-Quest.com
  • 思達科技 | STAR TECHNOLOGIES
  • ABOUT US
    • COMPANY PROFILE
    • PHILOSOPHY
    • MILESTONE
    • MANAGEMENT
    • QUALITY POLICY
    • CSR POLICY
  • PRODUCTS
    • PARAMETRIC INSTRUMENT
    • RELIABILITY TEST SYSTEM
    • AUTOMATED TEST EQUIPMENT
    • YIELD ENHANCEMENT
    • METROLOGY TOOL
    • PARAMETRIC PROBE CARD
    • FUNCTIONAL PROBE CARD
    • VERTICAL PROBE CARD
    • MEMS PROBE CARD
    • CONDUCTIVE ELASTOMER
    • PROBE STATION
    • PROFESSIONAL SERVICE
  • SOLUTIONS
    • PARAMETRIC TEST
    • RELIABILITY TEST
    • IC AUTOMATED TEST
    • RF & WIRESLESS TEST
    • PHOTONICS &OPTRONIC TEST
    • POWER ELECRONICS TEST
    • FPD & LED TEST
  • NEWS & EVENTS
    • NEWS
    • - ARCHIEVE 2024
    • - ARCHIEVE 2023
    • - ARCHIEVE 2022
    • - ARCHIEVE 2021
    • EVENTS
  • CONTACT US
    • GROUP COMPANY
    • GLOBAL SALES NETWORK
  • PARTNERS
    • BUSINESS PARTNERS
    • SOLUTION PARTNERS
    • INDUSTRY PARTNERS

products > PROFESSIONAL SERVICE

PROFESSIONAL SERVICE

STAr provides professional services with expert advices to customers and partners in semiconductor industry.

Parametric and Reliability Test Services

Parametric and Reliability Test Services

Parametric and Reliability Test Services

Parametric and Reliability Test Services

STAr Lab is equipped with multi-million-dollar testing equipment and probe stations for providing advanced parametric and reliability test services.  The years of expertise coupled with its high-end test equipment and software enable customers to complete the full semiconductor device characterization and reliability qualification at a single location.

Silicon Photonics Test Services

Parametric and Reliability Test Services

Parametric and Reliability Test Services

Silicon Photonics Test Services

STAr engages in advanced Silicon Photonics tests integrating DC, RF and Optical tests in a single platform enabling one-pass characterization of silicon photonics devices. STAr further assist customers in developing automated cost-effective wafer-level production test-and-probe system for high-volume manufacturing silicon photonics integrated circuits.

Probe Card and Loadboard Design

Probe Card and Loadboard Design

Probe Card and Loadboard Design

Probe Card and Loadboard Design

STAr provides high quality PCB design and turnkey manufacturing services for probe cards and load boards used in semiconductor test systems with the very best service at competitive prices. 

IC Assembly and Packaging

Probe Card and Loadboard Design

Probe Card and Loadboard Design

IC Assembly and Packaging

STAr group company provides nanometer technology applications such as ultra-fine scribe-line wafer dicing, low-pressure bonding, high temperature packaging, ESD free packaging for integrated circuits with minimal or no ESD protection circuitries, etc.

Technology Consulting

Technology Consulting

STAr’s technical services entail recommendations and implements of certain software or hardware solutions into the test segments of research, reliability and manufacturing organizations in order to streamline processes by increasing efficiency and cutting costs.

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