PRODUCTS > PARAMETRIC INSTRUMENT

Keysight B1500A Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements and also fast high-voltage pulsing.

Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available today with the capability to characterize high power devices from the sub-picoamp level up to 3000 volts and 20 amps. 

Keysight B1506A Power Device Analyzer for Circuit Design is complete solution that can help power electronic circuit designers maximize the value of their power electronics products and evaluate all relevant device parameters.

Keysight B1507A Power Device Capacitance Analyzer meets the need to evaluate power device capacitance (such as input, output, and reverse transfer capacitances).

Keysight E526xA/E5270B provides a solution that both meets their needs and lowers their cost of test. The wide variety of available modules and advanced measurement features provide a complete solution for parametric measurement and analysis.

Keysight B2900A series are single and dual channels cost effective SMUs (Source/Measure Units) with capabilities for a wide variety of IV (current-voltage) measurement tasks that require both high resolution and accuracy.

Keysight 4294A is a powerful tool for design, qualification, quality control, and production testing of semiconductor devices.

Keysight E4980A precision LCR meter provides the best combination of accuracy, speed, and versatility for a wide range of component measurements. 

Keysight 81110A with one or two output modules is a single/dual-channel 165 MHz pulse pattern generator. Either Keysight 81101A or 81104A modules can be integrated to perform streams of controlled output pulses with amplitude ranging from 100mV to 20V and with transition time ranges from 3 ns to 200 ms.

STAr Taurus Series TS-850x switch matrix mainframes are developed for most advanced semiconductor test switching application and support 1kV and 2kV high voltage low leakage current 10x12 switch matrix card.

STAr Taurus Series TS-8509 switch matrix mainframes support leakage current DC to high frequency RF test and the configuration including high voltage module up to 3kV.

Keysight B2200A fA leakage Switch Mainframe provides exceptional low-current leakage and capacitance measurement performance, without the limitations imposed by alternative solutions.

Keysight B2201A reduces the cost of test by enabling characterization tests to be automated, with almost no compromise to the measurement performance of the semiconductor parameter analyzer. 

Keysight E5250A low-leakage switch mainframe that easily expands the capability of a single measurement instrument, such as the Keysight B1500A, 4155C, or 4156C, to an automated measurement system.

Sagittarius TMS supports applications covering device characterization, SPICE modeling, advanced reliability, etc., and the solutions spanning across all semiconductor manufacturing needs covering CMOS, Si/GaAs ICs, FPD, smart high-power ICs, wired/wireless communications components, RFICs, RF MOSFET, Silicon Photonics devices, etc.

STAr Sagittarius RMS is an all-in-one tester software including comprehensive calibration, and RF ICs device characterization test and supports engineering test to full automation across a wafer with integrated probe station.

Sagittarius ICT is a full function user friendly interactive control software for most parametric instruments or systems and the unified environment also allows developing of test flows by using GUIs without the need for any programming.

STAr Sagittarius ICT-Lite is a lite version of Sagittarius ICT and provides user friendly GUI and make measurement becomes easy for general IV characterization. It supports B2900 and Keithley 2400/2600 series, some of the more popular SMUs.

EasyEXPERT's applications enables the user to become immediately productive on a broader range of measurement and device types without having to spend hours or days learning the instrument hardware.

Keysight Metrics I/CV controls semiconductor parametric test and measurement instrumentation. It provides easy setup for complex instrumentation through an interactive graphical user interface and requires no programming by the end user.