SOLUTIONS > PRELIABILITY TEST SOLUTIONS
STAr provides complete and advanced semiconductor reliability test systems to industry customers, comprising of design for package-level and wafer-level reliability characterization qualification to meet defacto standards.
- ALL-IN-ONE PER-PIN RELIABILITY TESTERS
- ADVANCED PARALLEL RELIABILITY TESTERS
ADVANCED PARALLEL RELIABILITY TESTERS
Scorpio HCI/BTI/GOI/TDDB Package-Level Reliability Tester
Scorpio HCI/BTI/GOI/TDDB Package-Level Reliability Tester
Scorpio HCI/BTI/GOI/TDDB Package-Level Reliability Tester
STAr Scorpio HCI/BTI/TDDB/DCEM Package Level Reliability Tester is equipped with JEDEC compliant test requirements for advance and accurate MOSFET HCI, NBTI and OTF reliability qualifications.
Scorpio HCI/BTI/GOI/TDDB Wafer-Level Reliability Tester
Scorpio HCI/BTI/GOI/TDDB Package-Level Reliability Tester
Scorpio HCI/BTI/GOI/TDDB Package-Level Reliability Tester
STAr Scorpio GOI/TDDB Wafer Level Reliability Tester additional Fast-VTDDB and multi-voltage level VSILC functions allow continuous stress bias with short interval monitoring for high resolution time-to-breakdown for WLR applications.
ALL-IN-ONE PER-PIN RELIABILITY TESTERS
Pluto HCI/BTI/TDDB/DCEM Package-Level Reliability Tester
Pluto HCI/BTI/TDDB/DCEM Package-Level Reliability Tester
Pluto HCI/BTI/TDDB/DCEM Package-Level Reliability Tester
- All-in-One tester covering all modes of reliability tests for PLR qualifications
- Per Pin SMU Configuration with source-measure capabilities
Pluto HCI/BTI/TDDB/DCEM Wafer-Level Reliability Tester
Pluto HCI/BTI/TDDB/DCEM Package-Level Reliability Tester
Pluto HCI/BTI/TDDB/DCEM Package-Level Reliability Tester
- All-in-One tester covering all modes of reliability tests for PLR/WLR qualifications
- Enhance measurement accuracy & efficiency to meet engineering & production needs
Scorpio hiVIP HCE/TDDB Package-Level Reliability Tester
Scorpio hiVIP HCE/TDDB Package-Level Reliability Tester
Scorpio hiVIP HCE/TDDB Package-Level Reliability Tester
STAr Scorpio hiVIP HCE/TDDB Package Level Reliability Tester covers the reliability requirements for high power devices with voltage requirement up to +200 V.
Scorpio hiVIP HCE/TDDB Wafer-Level Reliability Tester
Scorpio hiVIP HCE/TDDB Package-Level Reliability Tester
Scorpio hiVIP HCE/TDDB Package-Level Reliability Tester
STAr Scorpio hiVIP HCE/TDDB Wafer Level Reliability Tester applications include safe operations area (SOA) analysis of HCE, HTRB and HTGB.