SOLUTIONS > POWER ELECRONICS TEST SOLUTIONS
STAr's power electronics test solutions included developed software and hardware to apply in industries in semiconductor, LEDs devices, communications, etc.
- HIV SWITCH TEST SYSTEM
- POWER DEVICE QUALIFICATION RELIABILITY TEST SYSTEM
- SEMI-AUTOMATED PROBE STATION
- INTEGRATED TEST SYSTEM
HIV SWITCH TEST SYSTEM
Accel-RF High Voltage Switching Test System
Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25 A (on) at rates up to 1‑MHz switching frequency, dependent on voltage.
POWER DEVICE QUALIFICATION RELIABILITY TEST SYSTEM
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
STAr Scorpio hiVIP HCE/HTRB/HTGB Reliability Tester is designed to support precise low and high voltage stress bias at board level to fulfill the test needs of DMOS, IGBT and power MOSFETs. Power devices reliability applications include safe operations area (SOA) analysis of HCE, HTRB and HTGB.
Apollo HTRB/HTGB/HTOL Reliability Tester
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
Scorpio hiVIP – HCE/HTRB/HTGB Reliability Tester
STAr Apollo-HTBR/HTGB/HTOL reliability tester including high performance thermal ovens, Burn-In Boards, driver boards and software and allows many qualifications at different temperatures and electrical stimulus to be performed simultaneously.
SEMI-AUTOMATED PROBE STATION
Magic-A200e High Power Semiautomated Probe station
Magic-A200e High Power Semiautomated Probe station
Magic-A200e High Power Semiautomated Probe station
STAr Magic-A200e is high power semi-automatic probe station to ensure reliable measurements for precision device characterization, wafer-level reliability and failure analysis, high-speed component wafer sort, etc.
Magic-A200a High Power Manual Probe station
Magic-A200e High Power Semiautomated Probe station
Magic-A200e High Power Semiautomated Probe station
Magic-P200e High Power Semiautomated Probe station
Magic-P200e High Power Semiautomated Probe station
Magic-P200e High Power Semiautomated Probe station
STAr Magic-P200e is an excellent probe station to perform device characterization, wafer-level reliability qualification, SPICE modeling or yield enhancement.
Magic-P300e High Power Semiautomated Probe station
Magic-P200e High Power Semiautomated Probe station
Magic-P200e High Power Semiautomated Probe station
STAr Magic-P300e is engineering probe stations equipped with precision wafer alignment for tri-temp low-leakage DC and high frequency RF tests.
INTEGRATED TEST SYSTEM
Sagittarius TMS – Intelligent Test & Measurement System
Sagittarius TMS – Intelligent Test & Measurement System
Sagittarius TMS – Intelligent Test & Measurement System
STAr Sagittarius revolutionizes the era in semiconductor device parametric test and measurement solutions spanning across all semiconductor manufacturing needs covering CMOS, Si/GaAs ICs, flat-panel display (FPD), smart high-power ICs, wired/ wireless communications components, RFICs, RF MOSFET, Silicon Photonics devices, and etc.
Sagittarius TMS – Intelligent Test & Measurement System
Sagittarius TMS – Intelligent Test & Measurement System