STAr Technologies Participates in SWTest Asia 2024, Fukuoka Japan
STAr Technologies, a well-known supplier of semiconductor test probe card, will participate in SWTEST Asia - the prominent conference and exhibition in the industry from October 24 to 26 this week. This year, SWTest Asia is hosted at Hilton Fukuoka Sea Hawk, Fukuoka of Japan for the first time and there are nearly 50 companies in the semiconductor industry onsite. With the venue located in Kyushu, close to Kumamoto City, the event attracts lots of industry professionals and exchange information in test technology and market trend.
STAr is committed to developing cutting-edge test products to the market and to meet the growing test needs. At the exhibition, our sales team will present MEMS test probe card to the visitors at Booth No. 312. The probe card series cover applications in WAT test for minification process-ICs, high-voltage and high-current volume production burn-in test, COMS image sensor, etc. and are effective in measurement accuracy and efficiency enhancement to reduce cost-of-test to the manufactures.
Dr. Choon-Leong Lou, CEO & CTO of STAr Technologies said, “SWTEST, the semiconductor wafer test conference is an important event to semiconductor test industry. We are glad to join the exhibition in Fukuoka, Japan this year. Through the face-to-face meetings with industry elites, we will continuously bring our customers the most advanced probing solutions.”
For more information about STAr’s MEMS probe card, please visit our website at https://star-quest.com/mems-probe-card.
STAr Sagittarius Series Intelligent Integrated Test System
STAr Sagittarius Series, launched in 2001, is an intelligent test software designed for semiconductor parametric and reliability test and enables to integrate capacitance-voltage (CV) and current-voltage (IV) measurements into one single platform. As a result of electronics application becomes more diversified, the Sagittarius System has been continuously developed to meet industry measurement needs in the past 20 years, and with more than 3000 copies deployed in foundries, design houses and IDMs at present.
The Sagittarius Series is WindowsTM-based semiconductor parametric test and device characterization test software and integrates seamlessly into most benchtop instruments and probe stations. The software is also a comprehensive tool and accelerates the measurement process. Its graphical configuration and intuitive graphical-based test sequences enable users easily to configure test system with unlimited matrix or multiplexer and test resources such as SMU, CMU by drag-and-drop with just a few clicks.
Moreover, Sagittarius Series Intelligent Test System is under the master-slave operation and controls up to 32 slaves via internet connectivity. All test modes such as control, extra operation steps saving, test setup and test data files are in central management by Master which can view and collect latest update of all Salves system status. With full automation operation for multi-wafer, large statistics sample collection and built-in algorithms/libraries, Sagittarius Series ensures accurate and reliable measurement data for GaN, SiC, MOS, RFICs, RF MOSFET, Silicon Photonics Devices,
Si/GaAs ICs, FPD and CMOS, etc.
STAr Sagittarius Family Series include:
Sagittarius-TMS Intelligent Test & Measurement System
Sagittarius-RMS RF Measurement System
Sagittarius-ICT Interactive Curve Tracer
Sagittarius-SPT Silicon Photonics Test System
Sagittarius-WLR Wafer Level Reliability Test System
Sagittarius-MTM Multi-Test Mode System
Sagittarius-AMT Advanced Memory Tester
For more product information, please contact STAr’s sales representatives or email STAr via URL.
STAr Technologies Actively Presents 3D/2.5D MEMS Probe Card Family for WAT Test
STAr Technologies, a leading semiconductor test probe card supplier, announces the launch of new 3D/2.5D MEMS micro-cantilever probe card family for WAT (Wafer acceptance test, WAT) test. The Virgo-Prima series presents the capability of the convergence of probe card application, manufacturing, and measurement. With optimized design and structure, the MEMS probe card series provides industry customers the best interface solution in wafer level parametric and reliability test.
Addressing the escalating demands for high performance computing (HPC) and high-capacity data analysis, probe card manufacturers continuously focus on advanced probe development, and MEMS probe technology has been regarded as the critical competitive factor. Following the launch of 3D/2.5D MEMS micro-cantilever WAT probe card, STAr presents more innovations in MEMS probe card design to correspond the test needs for electrical measurements and to achieve higher production yield.
Virgo-Prima Series MEMS probe card supports wide temperature measurement from room temperature to 150degC and applications covering industry test requirements such as HCI, NBTI, TDDB, EM, and RF signal integrity, etc. In addition to support Keysight 4070/4080 series parametric tester, STAr also launches WAT MEMS probe card for most testers applied in the industry such as Keysight MPPT, P9002A, etc., for characteristic verification. The probe card family with changeable core adaptive to different PCB design enables to reduce alignment time and maintain tester availability.
Dr. Choon-Leong Lou, CEO&CTO of STAr Technologies said, “To semiconductor manufacturers, WAT test is an increasingly important process with more diverse industry applications and hybrid devices become prevalent. Probe cards, as the test interface, are costly consumables and necessary to ensure that the analysis result toward reliable. STAr Virgo MEMS probe card family is specifically designed for the market trend and is the best probing solution to manufacturers for future development.”
Mini-and Micro LED Tester Adapts to Application Developments
At the beginning of 2024, when we greeted the fresh start after COVID-19 economics turndown, technology and electronic products showcased at iconic tradeshows, such as AI chips provide higher quality pictures, and screens can be glare-free or even transparent, etc., have caught our eyes and brought us new visual experiences. This reflects that industry development of mini-and micro- LEDs is mature and extends the application categories to meet consumers’ requirements in daily life.
For devices manufacturers, corresponding to the market trend, to keep the capacity and quality is the core capability. STAr Technologies has launched test probe solution, the Unicorn-LAIT Series, for fine pitch mini- and micro-LEDs test for years and continuously upgrades the configuration and functions to meet the industry test needs. Based on flexible architecture platform, the Unicorn-LATI tester integrated parallel testing with probe station and probe card enables small pads probing with needle force under control. Meanwhile, equipped with high-efficient Dark and EMI Shield test chamber, the tester also supports comprehensive analysis and ensures accurate measurement results.
Unicorn LAIT Mini- and Micro- LEDs tester integrates Magic-A200e probe station and allows alignment of up to 6-in wafer and probing with Multi-DUT LEDs test probe cards. The closed-loop XYZ stages and coaxial microscopes ensure accurate stepping, high resolution scanning and probing. The ceramic chuck enables cleaning and contact-check to enhance test performance and reliable result. Moreover, the tester can be upgradeable with an autoloader for a fully automatic test with a cassette. Designed for parallel testing, the tester does efficiently accomplish device manufacturers’ expectations for high throughput production to meet customers’ assembly schedule.
Dr. Choon-Leong Lou, CEO and CTO of STAr Technologies commented, “Technology development is speedy and application of small pitch mini- and micro LEDs extends. To manufacturers, advanced and cost-effective test solutions are critical and required. Unicorn LAIT tester is ideal for electrical, optical measurement, driver functionality, RGB testing, etc., to industry customers.”
STAr Technologies and EDA Industries announce Strategic Partnership
STAr Technologies, Inc. (“STAr”) and EDA Industries (“EDA”) are pleased to announce a mutually strategic business expansion partnership. Combining product scopes and sales networks, this agreement will lead STAr and EDA’s growth in the global semiconductor testingmarket at the highest level.
With technologies and applications continuously driving the increase in the demands of ICs, semiconductor players face growing challenges especially in production management and must guarantee overall device cost reduction as well as adequate quality and yield. In this scenario, STAr and EDA have decided to strengthen their business cooperation relationship to meet the ever-increasing requirements of the semiconductor industry. STAr will be a sales representative of EDA products and services in the global market, in particular U.S.A, Japan, South Korea and Taiwan. Meanwhile, EDA will support STAr in EU markets (in particular Italy) and Morocco. The complete sales and service network will significantly benefit industry customers.
EDA, established in 1993 in Italy, is a dynamic and experienced international company, providing Turn-Key Solutions and Services for Reliability, Burn-in and Testing of Semiconductor Devices, both at Wafer and Package Level. Recently EDA is investing on Testing solutions also for Power Modules.
STAr Technologies, founded in 2000 in Hsinchu of Taiwan, is a supplier of semiconductor test total solutions and provides test systems, software, consumables and services to semiconductor and optical industry companies. Its expertise extends across parametric E-test, WLR & PLR.
Dr. Fortunato Palella, Founder of EDA Industries, commented: “We are glad to announce this important partnership with STAr Technologies. Thanks to this agreement and the integration of sales and marketing strategy, our business will be on a new scale, allowing us to increase our coverage of the global semiconductor market, as well as to highlight our deep industry knowledge and expertise”.
Dr. Choon-Leong Lou, CEO & CTO of STAr Technologies, said: “Testing is a critical process to semiconductor manufacturing and value demonstrated for ICs. We look forward to the year ahead with EDA as partnership promises sales and service cooperation and provide customers the complementary test solutions in the future”.
STAr Sagittarius-SPT Automated Silicon Photonics On-Wafer Tester
In recently years, attributed to the application development on New Generation Artificial Intelligence (AI) and Internet of Things (IoT), demand for high performance computing (HPC) and high-capacity data analysis has increased dramatically and leads related industries to look for more solutions of devices or components with advantages of high integration density and more energy efficient, etc. Silicon Photonics, applied in communication or sensors, has attracted attention with the market trend and is expected to bring the data processing revolution.
Sagittarius-SPT, launched by STAr Technologies, is specifically developed for electro-optics and wafer-level characteristics/acceptance test of silicon-photonics (SiPh) devices, and provides full automation and semi-automated options to manufacturers to correspond to different test requirements and challenges. Configured with STAr Sagittarius Integrated System software, the automatic Sagittarius-SPT On-Wafer tester enables instruments and prober controls and measurement methodology developments and adapts to test demand with key aspect of wafer-level testing, including probe-position optimization and polarization alignment to fast reproduce optical coupling.
The Sagittarius-SPT Series tester also presents breakthroughs including automatic test platforms for the testing wafer and components prior to wafer dicing and with capability of wafer probing for DC and RF electrical test integrated to the testing in the optical domain. Meanwhile, with multiple instrument drivers for light wave component analyzer (LCA), optical switch, tunable laser source, optical power meter, etc., the tester series supports test for variable optical attenuator (VOA), optical modulator, and laser photo diodes, etc.
“Silicon Photonics is a groundbreaking approach to data processing and communication and technology integrated several technical blocks including lasers, optics, MEMs, high-speed digital and RF SOCs. STAr Sagittarius-SPT is specifically designed for future fiber optics devices and critical On-Wafer test solution with economic efficiency and higher energy efficiency to electro-optical manufacturers and industry companies,” said Dr. Choon-Leong Lou, CEO & CTO of STAr Technologies, Inc.
"A STAr is Born" Program Supports the Primary School Students Carefree Schooling and Turn their Life Around
The scholarship award ceremony of "A STAr is Born", program launched by STAr Technologies, the semiconductor test equipment and probe card supplier, was held on January 16, Miaoli County Magistrate Mr. Tung-Chin Chung, Director of Education Ministry Ms. Shin-Hui Yean and Chairman of STAr Technologies Dr. Choon-Leong Lou were in attendance. In this ceremony, primary school students awarded and their teacher were invited and STAr Technologies’ team leaders were also onsite to have conversation with children about their school lives and encouraged their continuous learning to make dreams come true in the future.
"A STAr is Born" is a long-term sponsor program launched by Chairman of STAr Technologies, Dr. Choon-Leong Lou and implemented by Miaoli County Government. The program comprises of annual donation of more than NT$4 million yearly with monthly bursaries and semester scholarships to all 118 primary schools in Miaoli County from 2022 academic year. Meanwhile, the annual award ceremony is an opportunity to further understand the impact and benefits to the primary school students. "A STAr is Born" program is to practice the corporate philosophy – "Taken from the community, giving back to society" and cultivate the talents by education support.
Dr. Lou, Chairman of STAr Technologies, is from Singapore and mentioned that he was from a not well-off family and received scholarship provided by enterprises to continue and accomplish his study. Building up the enterprise in Taiwan over 20 years, Dr. Lou mentioned that he has received supports and assistance from industry customers and local colleagues. He is honored to launch the long-term program in education as a contribution to the society and expected that "A STAr is Born" brings a different future to the awarded students who will turn their lives around with good attitude in learning and passion for school life.
The “A STAr is Born” Scholarship Award Ceremony for Academic Year 2023
On Tuesday, January 16 of 2024, the “A STAr is Born” scholarship in 2023 academic year was held at 1:30PM, Grand Royal Hotel, Toufen City, Miaoli County. Mr. Tung-Chin Chung, Miaoli Country Magistrate, Ms. Shin-Hui Yean, Director of Education Ministry and Dr. Choon-Leong Lou, Chairman of STAr Technologies attended the ceremony and encouraged the primary students to continue their passion in learning.
The “A STAr is Born” is a long-term program launched by Dr. Choon-Leong Lou to offer scholarships and monthly bursaries to all primary school in Miaoli County since 2022 academic year. STAr also hosts the annual award ceremony as a gathering with students awarded and an opportunity to further understand how the program affects and motivates their school life. To ensure the process exactly meets the goal “A STAr is Born” program.
“I am glad to be here again and talk to the students awarded for the program. Thanks for everyone in Miaoli Couty government, all the primary schools, and the staff of STAr to make the “A STAr is Born” come true. Never stop children’s development is required. To contribute to the society, except to study, learning skill is also very important. I hope that the program will bring a different life and future to every student,” said Dr. Choon-Leong Lou, Chairman of STAr Technologies.
Miaoli Country Magistrate Mr. Tung-Chin Chung expressed the encouraged the primary students awarded to set a goal for school life and try it best to complete it. He further commented that to keep the spirit of the program in mind and to become a talent and good person is the most valuable way to practice the aim of “A STAr is Born”.
© 2024 STAR TECHNOLOGIES. ALL RIGHT RESERVED.
We use cookies to improve your user experience and for web traffic statistics purposes. By continuing to use this website, you agree to our use of cookies. Our Privacy & Cookie Policy contains more information on such use and explains how to disable cookies.