2025.08.29
STAr Technologies Celebrates 25 years of powering semiconductor test solutions
Marking a quarter century of expertise and innovation, STAr looks ahead to empowering the connections to the future technology and the next generation of test challenges.
STAr Technologies, a leading supplier in semiconductor test system and probe card, started an ambitious vision in 2000 and has grown into a company with network of technological breakthroughs and empowers industry customers to manufacture and engineer semiconductor devices in more efficient, cost-effective ways. Today, STAr is celebrating the 25th anniversary and looking to the further of building more supportive solutions to meet the test needs for next generation.
STAr Technologies, a leading supplier in semiconductor test system and probe card, started an ambitious vision in 2000 and has grown into a company with network of technological breakthroughs and empowers industry customers to manufacture and engineer semiconductor devices in more efficient, cost-effective ways. Today, STAr is celebrating the 25th anniversary and looking to the further of building more supportive solutions to meet the test needs for next generation.
“The past 25 years have been filled with accomplishments, but the greatest achievements are yet to come.” said Dr. Choon-Leong Lou, CEO and the Founder of STAr Technologies. “Just as the slogan, dreams come true, created at the beginning, we hope to build STAr a remarkable company in semiconductor test industry and an enterprise where people enjoy working towards a long-term goal. We never forge our persistence and will make it come true.”
Founded on Aug. 29, 2000, STAr Technologies is the first supplier specializing in semiconductor parametric testing in Asia. Now our products include parametric instruments, WLR/PLR reliability test systems, ATE, probe stations, WAT test probe cards, wafer sort probe card, etc. Less than 10 at the beginning, we have nearly 1000 employees to empower our global sales and service network and to face the future semiconductor test challenges with our clients.
2025.08.06
STAr Unveils Apollo Reliability Test System to High Power Devices
High Performance HTRB/HTGB/H3TRB Reliability Test System
STAr Technologies, the leading semiconductor test system supplier, today announced the launch of Apollo HTGB/HRTB/H3TRB Reliability Test System. The platform is engineered to support the power devices like GaN, SiC, MOSFET, IGBT, etc.
Increasing high-speed charging and memory technologies are pushing the development of the cutting-edge application. STAr Apollo series system is critical to adapting the continuous growing demands of EV, AI and high-performance computing and particularly designed to address test challenge driven by the market trend and enables accurate measurement to meet MIL-STD-750, JESD22-A108 and AEC-Q101 requirements.
Featuring the application of high-performance reliability test, the Apollo system is developed to particularly apply to HTRB, HTGB, H3TRB for high power devices. Delivering high voltage measurement up to ±2000V (HTRB) and ±200V (HTGB) with measurement algorithm includes Vth, Ron, Idss, Igss, IV curve, etc., the system is configured thermal oven in wide temperature Range at 30degC to 200degC and is equipped 12 burn-in boards with two stress biases (D/G) for parallel test up to 144 DUTs.
Yu-Ming Chien, Senior Vice President of Test and Measurement Business Unit commented, “AI and edge computing continuously evolved, reliability test for high power semiconductor device is getting critical to manufacturers. Apollo HTRB/HTGB/H3TRB reliability test system ensures our customer to validate the characteristics of high-power device and bring them to the market efficiently.”
To learn more about STAr Apollo HTRB/HTGB/H3TRB reliability test system, please contact our global sales network or email to Sales@star-quest.com.
STAr Apollo reliability test system for high power device reliability
2025.03.18
STAr Virgo Prima Series 3D/2.5D MEMS Probe Card for WAT Test
STAr Technologies, a leading probe card manufacturer, has been engaged in probe card technology for 25 years and is at the cutting edge of probe card manufacturing. The launch of STAr Virgo Prima, which is one of probe card series for semiconductor parametric and reliability test, presents the achievement in 3D/2.5D MEMS probe card development for WAT test (Wafer Acceptance Test, WAT) and provides users the positive effects on test efficiency and reliable results.
MEMS (Micro-Electro-Mechanical Systems, MEMS) probe card with the optimized structure and is an ideal to support fine-pitch and high-pin count test requirements. The Virgo Prima MEMS micro-cantilever probe cards taking the advantages of MEMS probe and experience-based techniques are designed specifically for nanometer technology, node processing and extend performance beyond existing WAT test probe cards.
Virgo Prima Probe Card features include：
- Small probe mark with low-scrub depth
- Low parasitic LC and low leakage current
- Superior ground shield for complete noise isolation
- High-temperature reliability tests up to 200degC (HCI, NBTI, TDDB, EM)
“WAT probe cards play a vital role in characterization qualification to the manufacturing of semiconductor.” Yu-Ming Chien, STAr Technologies’ Senior Vice President of Test and Measurement Business Unit commented, “STAr Virgo Prima Series ensure excellent test performance and exactly corresponding to the emerging test needs semiconductor industry and technologies of diverse applications.”
Virgo Prima 3D/2.5D MEMS Probe Card
2025.01.24
STAr Korea Receives Best Supplier Award from DB HiTek
Seoul, South Korea – STAr Technologies, LLC. (Korean :스타테크놀러지스코리아 유한회사) announced that it has received the Best Supplier Award from DB HiTek Co., Ltd. (Korean: 주식회사 동부하이텍) in Project Development and Growth category. The award is given in recognition of supplier’s contribution to DB HiTek’s semiconductor test technology through 2024.
STAr Technologies, LLC. (STAr Korea), one of STAr Technologies group companies, was found in 2002 with the goal of being one supportive partner to semiconductor industry clients in South Korea market. Over 20 years, STAr Korea continuously responds the market trends and provides clients the most effective test solutions and services.
In 2024, STAr Korea and DB HiTek collaborated on the high-power application for SiC, GaN and achieved good results. The receipt of the Best Supplier Award represents a recognition of STAr Korea’s contribution and encourages us to continue our effort at development for semiconductor test technologies spanning diverse applications.
“We are deeply pleased and honored to receive the outstanding recognition. The award not only highlights our achievement in current but also recognizes the partnership between DB HiTek and us. We do look forward to the future cooperation opportunity,” said Byong-Sun Choi, General of STAr Korea, STAr Technologies, LLC.
About DB HiTek
DB HiTek Co., Ltd. ranks today as one of the top ten foundries in the semiconductor industry. Operating from two world class wafer fabrication facilities and leveraging key technology achievements spanning two decades, the company continues to meet the needs of fabless ventures around the globe.
About STAr Technologies
STAr Technologies, headquartered in Hsinchu, Taiwan and has branches in South Korea, U.S.A., Japan, Singapore, Philippines, China and Idea, specializes in test solutions to meet the requirements and challenges within semiconductor and optical device industries.
STAr Korea Team received the award of Best Supplier Award from DB HiTek
2025.01.04
STAr Technologies “A STAr is Born” Fellowship Ceremony
To encourage excellent students to study diligently, the fellowship ceremony for “A STAr is Born” was held in Grand Royal Hotel, Toufen City, Miaoli County, on the morning of January 3rd, 2025. Miaoli County Magistrate Mr. Tung-Chin Chung, Director of Education Ministry Ms. Shin-Hui Yean, STAr Technologies’ CEO Dr. Choon-Leong Lou and Chairman Mr. Yu-Ming Chien were in attendance. “A STAr is Born” program has been implemented for three years. With this program, we inspire the children studying in adversity and help them steadily make their dreams come true step by step.
At the ceremony, the primary students expressed their gratitude to Dr. Choon-Leong Lou and talk with him about their school lives with warm atmosphere. “Children are our future. We would like to reduce their families’ loading by fellowship awarded, so that the students will focus on study and move toward a boarder stage in the future. Thanks for the staff and faculties in Miaoli County and members of STAr Technologies’ support and keep “A STAr is Born” come true.” said Dr. Choon-Leong Lou, CEO of STAr Technologies.
Miaoli County Magistrate Mr. Tung-Chin Chung thanked Dr. Choon-Leong Lou for his concern about basic education. He commented on this fellowship program that provides primary school students appropriate assistance to have carefree schooling. He also encouraged the awarded students to set a goal for school life and try their best to realize it. To become a talent is the way to practice the aim of “A STAr is Born”.