products > FUNCTIONAL PROBE CARD
STAr’s functional test cantilever probe cards represent the finest technology on the market for wafer-sort, built-in self-tests (BIST), known good die (KGD), burn-in, image sensor etc.
Aries-SIPs SOC IC Test Probe Card
Aries-LIPs LCD Driver IC Test Probe Card
Aries-LIPs LCD Driver IC Test Probe Card
STAr Aries-SIPs SOC ICs test probe cards are designed for use with digital mixed-signal, analog, CIS and power ICs and support probing of small, bumped pads, all grid array (BGA), circuits under pads (CUP), etc.
Aries-LIPs LCD Driver IC Test Probe Card
Aries-LIPs LCD Driver IC Test Probe Card
Aries-LIPs LCD Driver IC Test Probe Card
STAr Aries-LIPs LCD Driver ICs Probe Cards enable ultra-small pitch and high frequency probing and applied in most technologies such as AI pad/Au bump/TAB/COF at CP or FT (Chip probe or final test).
Aries-MIPS Memory IC Probe Card
Aries-LIPs LCD Driver IC Test Probe Card
Aries-Sigma CMOS Sensor Test Probe Card
STAr Aries-MIPs memory ICs test probe cards is built to sustian highly parallel test for DRAMs, SRAM, FLASH and memory chip sort, burn-in tests, etc., and supports for Advanced WLCSP and 3D-stacked dies testing.
Aries-Sigma CMOS Sensor Test Probe Card
Aries-Sigma CMOS Sensor Test Probe Card
Aries-Sigma CMOS Sensor Test Probe Card
STAr Aries-Sigma CMOS image sensor test probe card is an advanced probe card with integrated camera lens module and light source for testing emulated use condition. The replaceable probe head enables a high yield test with low—cost re-build and highest up-time.
Aries-LED Multi-DUT LED Test Probe Card
Aries-Sigma CMOS Sensor Test Probe Card
Aries-LED Multi-DUT LED Test Probe Card
STAr Aries LED probe card is a long lifetime multi-DUT probe card designed to parallel LED probing and integrated to Unicorn LAIT Mini-and Micro-LED tester and can be contacted for single touch-down with 96 probes.