products > FUNCTIONAL PROBE CARD
STAr’s functional test cantilever probe cards represent the finest technology on the market for wafer-sort, built-in self-tests (BIST), known good die (KGD), burn-in, image sensor etc.
Aries-SIPs SOC IC Test Probe Card
Aries-LIPs LCD Driver IC Test Probe Card
Aries-LIPs LCD Driver IC Test Probe Card
STAr Aries-SIPs (SOC IC Probe Cards) enables to support probing of small pads, bumped pads, all grid array (BGA), circuits under pads (CUP), etc.
Aries-LIPs LCD Driver IC Test Probe Card
Aries-LIPs LCD Driver IC Test Probe Card
Aries-LIPs LCD Driver IC Test Probe Card
STAr Aries-LIPs (LCD Driver IC Probe Cards) enables ultra-small pitch and high frequency probing and used in most technologies such as AI pad/Au bump/TAB/COF at chip probe (CP) or final test (FT).
Aries-MIPS Memory IC Probe Card
Aries-LIPs LCD Driver IC Test Probe Card
Aries-Sigma CMOS Sensor Test Probe Card
STAr Aries-MIPs (Memory IC Probe Cards) are designed and built to sustain highly parallel probing of DRAMs, SRAM, FLASH and memory chip sort, burn-in tests, etc.
Aries-Sigma CMOS Sensor Test Probe Card
Aries-Sigma CMOS Sensor Test Probe Card
Aries-Sigma CMOS Sensor Test Probe Card
STAr Aries-Sigma is an advanced probe card with integrated camera lens module and light source for CMOS image sensor testing under emulated use condition.
Aries-LED Multi-DUT LED Test Probe Card
Aries-Sigma CMOS Sensor Test Probe Card
Aries-LED Multi-DUT LED Test Probe Card
STAr Aries LED probe cards is designed to parallel LED probing and integrated to Unicorn LAIT LED Advanced Integrated Tester for Mini-LEDs and Micro-LEDs testing.