www.STAr-Quest.com
  • 思達科技 | STAR TECHNOLOGIES
  • ABOUT US
    • COMPANY PROFILE
    • PHILOSOPHY
    • MILESTONE
    • MANAGEMENT
    • QUALITY POLICY
    • CSR POLICY
  • PRODUCTS
    • PARAMETRIC INSTRUMENT
    • RELIABILITY TEST SYSTEM
    • AUTOMATED TEST EQUIPMENT
    • YIELD ENHANCEMENT
    • METROLOGY TOOL
    • PARAMETRIC PROBE CARD
    • FUNCTIONAL PROBE CARD
    • VERTICAL PROBE CARD
    • MEMS PROBE CARD
    • CONDUCTIVE ELASTOMER
    • PROBE STATION
    • PROFESSIONAL SERVICE
  • SOLUTIONS
    • PARAMETRIC TEST
    • RELIABILITY TEST
    • IC AUTOMATED TEST
    • RF & WIRESLESS TEST
    • PHOTONICS &OPTRONIC TEST
    • POWER ELECRONICS TEST
    • FPD & LED TEST
  • NEWS & EVENTS
    • NEWS
    • - ARCHIEVE 2024
    • - ARCHIEVE 2023
    • - ARCHIEVE 2022
    • - ARCHIEVE 2021
    • EVENTS
  • CONTACT US
    • GROUP COMPANY
    • GLOBAL SALES NETWORK
  • PARTNERS
    • BUSINESS PARTNERS
    • SOLUTION PARTNERS
    • INDUSTRY PARTNERS
www.STAr-Quest.com
  • 思達科技 | STAR TECHNOLOGIES
  • ABOUT US
    • COMPANY PROFILE
    • PHILOSOPHY
    • MILESTONE
    • MANAGEMENT
    • QUALITY POLICY
    • CSR POLICY
  • PRODUCTS
    • PARAMETRIC INSTRUMENT
    • RELIABILITY TEST SYSTEM
    • AUTOMATED TEST EQUIPMENT
    • YIELD ENHANCEMENT
    • METROLOGY TOOL
    • PARAMETRIC PROBE CARD
    • FUNCTIONAL PROBE CARD
    • VERTICAL PROBE CARD
    • MEMS PROBE CARD
    • CONDUCTIVE ELASTOMER
    • PROBE STATION
    • PROFESSIONAL SERVICE
  • SOLUTIONS
    • PARAMETRIC TEST
    • RELIABILITY TEST
    • IC AUTOMATED TEST
    • RF & WIRESLESS TEST
    • PHOTONICS &OPTRONIC TEST
    • POWER ELECRONICS TEST
    • FPD & LED TEST
  • NEWS & EVENTS
    • NEWS
    • - ARCHIEVE 2024
    • - ARCHIEVE 2023
    • - ARCHIEVE 2022
    • - ARCHIEVE 2021
    • EVENTS
  • CONTACT US
    • GROUP COMPANY
    • GLOBAL SALES NETWORK
  • PARTNERS
    • BUSINESS PARTNERS
    • SOLUTION PARTNERS
    • INDUSTRY PARTNERS

products > FUNCTIONAL PROBE CARD

STAr’s functional test probe cards represent the finest probing technology on the market for wafer-sort, built-in self-tests (BIST), Known good die (KGD), burn-in, image sensor, and HF/RF test, etc.

Zeus HF/RF Membrane Probe Card

Aries Sigma CMOS/CCD Sensor Test Probe Card

Aries-CPC DDI/LDI Test Probe Card

Zeus HF/RF membrane probe card is designed to address next-generation semiconductor testing and features tunable contact force, high channel density, and versatile RF connector options to ensure superior performance and signal integrity across diverse testing environments.

Aries-CPC DDI/LDI Test Probe Card

Aries Sigma CMOS/CCD Sensor Test Probe Card

Aries-CPC DDI/LDI Test Probe Card

Aries-LIPs LCD Driver IC Test Probe Card

STAr Aries CPC DDI/LDI is a cost-effective cantilever probe card enables ultra-small pitch and high frequency probing and applied in most technologies such as AI pad/Au bump/TAB/COF at chip probe (CP) or final test (FT).

Aries Sigma CMOS/CCD Sensor Test Probe Card

Aries Sigma CMOS/CCD Sensor Test Probe Card

Aries Sigma CMOS/CCD Sensor Test Probe Card

STAr Aries-Sigma CMOS/CCD image sensor test probe card is an advanced probe card with integrated camera lens module and light source, enabling high frequency testing for Gold Bump and COF-type LCD driver ICs.

Aries-SIPs SOC IC Test Probe Card

Aries-LED Multi-DUT LED Test Probe Card

Aries Sigma CMOS/CCD Sensor Test Probe Card

STAr Aries-SIPs SOC ICs test probe cards are designed for use with digital mixed-signal, analog, CIS and power ICs and support probing of small, bumped pads, all grid array (BGA), circuits under pads (CUP), etc.

Aries-MIPS Memory IC Probe Card

Aries-LED Multi-DUT LED Test Probe Card

Aries-LED Multi-DUT LED Test Probe Card

Aries-MIPS Memory IC Probe Card

STAr Aries-MIPs memory ICs test probe cards is built to sustian highly parallel test for DRAMs, SRAM, FLASH and memory chip sort, burn-in tests, etc., and supports for Advanced WLCSP and 3D-stacked dies testing.

Aries-LED Multi-DUT LED Test Probe Card

Aries-LED Multi-DUT LED Test Probe Card

Aries-LED Multi-DUT LED Test Probe Card

Aries-LED Multi-DUT LED Test Probe Card

STAr Aries LED probe card is a long lifetime multi-DUT probe card designed to parallel LED probing and integrated to Unicorn LAIT Mini-and Micro-LED tester and can be contacted for single touch-down with 96 probes.

© 2024 STAR TECHNOLOGIES. ALL RIGHT RESERVED. 

Cookies

  

We use cookies to improve your user experience and for web traffic statistics purposes. By continuing to use this website, you agree to our use of cookies. Our Privacy & Cookie Policy contains more information on such use and explains how to disable cookies.

ACCEPT