SOLUTIONS > RF & WIRESLESS TEST SOLUTIONS
STAr and group company Accel-RF have been devoted to RF and wireless test solutions for decades and focus on delivering the most innovative/advanced solutions and addressing industry customers’ testing need for today and the future.
RF-AARTS Automated Accelerated Reliability Test System
RF-AARTS Automated Accelerated Reliability Test System
RF-AARTS Automated Accelerated Reliability Test System
STAr RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus in order to evaluate reliability and performance
degradation.
Frequency Band Options
• 500MHz to 3GHz
• 1GHz to 4GHz
• 1GHz to 12GHz
• 2GHz to 18GHz
• 26GHz to 40GHz
• Other mmWave bands supported
Sagittarius RMS – RF Measurement System
RF-AARTS Automated Accelerated Reliability Test System
RF-AARTS Automated Accelerated Reliability Test System
STAr Sagittarius-RMS is All-In-One tester software including of comprehensive calibration, and RFIC device characterization test that integrates seamlessly with most measurement instruments and probe stations. Automatic setup and DC, RF instrument calibration feature. S-Parameter measurements at different bias voltage, temperature and subsites.
Functions
• Automatic calibration setup and measurement to probe-tip to achieve the most repeatable calibration with integrated probe station.
• DC, RF instrument calibration features to apply into test flow or to be triggered by auto calibration scheduling.
• S-Parameter measurements at different bias voltages, different temperatures, and different subsites.
• Built-in Test library for variety of RF devices, including Bipolar, FET transistors employing various technologies, passive elements such as inductors, capacitors, resistors, transmission lines and matching networks.