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www.STAr-Quest.com
  • 思達科技 | STAR TECHNOLOGIES
  • ABOUT US
    • COMPANY PROFILE
    • PHILOSOPHY
    • MILESTONE
    • MANAGEMENT
    • QUALITY POLICY
    • CSR POLICY
  • PRODUCTS
    • PARAMETRIC INSTRUMENT
    • RELIABILITY TEST SYSTEM
    • AUTOMATED TEST EQUIPMENT
    • YIELD ENHANCEMENT
    • METROLOGY TOOL
    • PARAMETRIC PROBE CARD
    • FUNCTIONAL PROBE CARD
    • VERTICAL PROBE CARD
    • MEMS PROBE CARD
    • CONDUCTIVE ELASTOMER
    • PROBE STATION
    • PROFESSIONAL SERVICE
  • SOLUTIONS
    • PARAMETRIC TEST
    • RELIABILITY TEST
    • IC AUTOMATED TEST
    • RF & WIRESLESS TEST
    • PHOTONICS &OPTRONIC TEST
    • POWER ELECRONICS TEST
    • FPD & LED TEST
  • NEWS & EVENTS
    • NEWS
    • - ARCHIEVE 2024
    • - ARCHIEVE 2023
    • - ARCHIEVE 2022
    • - ARCHIEVE 2021
    • EVENTS
  • CONTACT US
    • GROUP COMPANY
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SOLUTIONS > RF & WIRESLESS TEST SOLUTIONS

RF & WIRESLESS TEST SOLUTIONS

STAr and group company Accel-RF have been devoted to RF and wireless test solutions for decades and focus on delivering the most innovative/advanced solutions and addressing industry customers’ testing need for today and the future.

RF-AARTS Automated Accelerated Reliability Test System

RF-AARTS Automated Accelerated Reliability Test System

RF-AARTS Automated Accelerated Reliability Test System

RF-AARTS Automated Accelerated Reliability Test System

STAr RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus in order to evaluate reliability and performance 

degradation.


Frequency Band Options

• 500MHz to 3GHz

• 1GHz to 4GHz

• 1GHz to 12GHz

• 2GHz to 18GHz

• 26GHz to 40GHz

• Other mmWave bands supported 

Sagittarius RMS – RF Measurement System

RF-AARTS Automated Accelerated Reliability Test System

RF-AARTS Automated Accelerated Reliability Test System

Sagittarius RMS – RF Measurement System

STAr Sagittarius-RMS is All-In-One tester software including of comprehensive calibration, and RFIC device characterization test that integrates seamlessly with most measurement instruments and probe stations. Automatic setup and DC, RF instrument calibration feature. S-Parameter measurements at different bias voltage, temperature and subsites.


Functions

• Automatic calibration setup and measurement to probe-tip to achieve the most repeatable calibration with integrated probe station.

• DC, RF instrument calibration features to apply into test flow or to be triggered by auto calibration scheduling.

• S-Parameter measurements at different bias voltages, different temperatures, and different subsites.

• Built-in Test library for variety of RF devices, including Bipolar, FET transistors employing various technologies, passive elements such as inductors, capacitors, resistors, transmission lines and matching networks.

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