products > PROBE STATION
STAr offers complete range of probe station from lowest cost value-based 150 mm adaptive probe station to highest performance 300 mm precision engineering automatic probe station.
- 150MM PROBE STATION
- 200MM PROBE STATION
- 300MM PROBE STATION
- ADVANCED PROBE SYSTEM
- ACCESSORIES
150MM PROBE STATION
Magic-A150e - Adaptive Engineering Probe Station
STAr Magic-A150e adaptive semi-automatic probe station provides the best cost-performance tests for 150mm wafers. The probe station is an easy-to-use high-speed platform for components, power devices, compound semiconductors, etc.
200MM PROBE STATION
Magic-A200e - Adaptive Engineering Probe Station
STAr Magic-A200e adaptive engineering probe station ensures reliable measurements for precision device characterization, wafer-level reliability and failure analysis, high-speed component wafer sort, etc.
300MM PROBE STATION
Magic-P300m - Precision Engineering Probe Station
Magic-P300m - Precision Engineering Probe Station
Magic-P300m - Precision Engineering Probe Station
STAr Magic P300m is equipped with advanced liner air stages to provide extraordinary stepping accuracy and calibration chuck with high temperature shielding enclosure ensure high performance analysis result.
Magic-P300e - Precision Engineering Probe Station
Magic-P300m - Precision Engineering Probe Station
Magic-P300m - Precision Engineering Probe Station
STAr Magic-P300e is engineering probe stations equipped with precision wafer alignment for tri-temp low-leakage DC and high frequency RF tests.
Magic-X300e - Engineering Automatic Probe Station
Magic-X300e - Engineering Automatic Probe Station
Magic-X300e - Engineering Automatic Probe Station
STAr Magic-X300e is a close-cycle high precision semi-automated probe station and performs DC to RF, microwave and electro-optical probing and superconducting magnetic measurements.
Magic-X300a - Engineering Automatic Probe Station
Magic-X300e - Engineering Automatic Probe Station
Magic-X300e - Engineering Automatic Probe Station
STAr Magic-X300a is a close-cycle high precision fully auto probe station and performs DC to RF, microwave and electro-optical probing and superconducting magnetic measurements.
ADVANCED PROBE SYSTEM
Sagittarius-SPT - Silicon Photonics Test System
Unicorn-LAIT II - LED Advanced Integrated Tester
Unicorn-LAIT II - LED Advanced Integrated Tester
STAr Sagittarius-SPT is an electro-optics/silicon-photonics wafer-level test solutions for characterization and acceptance tests of silicon-photonics devices.
Unicorn-LAIT II - LED Advanced Integrated Tester
Unicorn-LAIT II - LED Advanced Integrated Tester
Unicorn-LAIT II - LED Advanced Integrated Tester
STAr Unicorn-LAIT II is an advanced high throughput integrated LED test system with integrated parallel PMU (parametric measurement unit), probe station and probe card.
ACCESSORIES
Capricorn-MP - Multi-Die Probe Positioner
Capricorn-MP - Multi-Die Probe Positioner
Capricorn-MP - Multi-Die Probe Positioner
STAr Capricorn MP Multi-Die Probe Positioner is a 6-axes (XYZ-aβθ) positioner that can hold a probe card of up to 26 probe pins for use with standard parametric tests or high temperature reliability tests.
Capricorn-MP - Multi-Die Probe Positioner
Capricorn-MP - Multi-Die Probe Positioner