products > PROBE STATION
STAr offers complete range of probe station from lowest cost value-based 150 mm adaptive probe station to highest performance 300 mm precision engineering automatic probe station.
- 150MM PROBE STATION
- 200MM PROBE STATION
- 300MM PROBE STATION
- ADVANCED PROBE SYSTEM
- ACCESSORIES
150MM PROBE STATION
Magic-A150e - Adaptive Engineering Probe Station
Magic-A150e adaptive semi-automatic probe station provides the best cost-performance testing for 150mm on-wafer probing testing. The probe wafer station is an easy-to-use high-speed platform and allows engineers to configure wide range optical and electrical instruments with choices of chuck size, thermal range and microscope options.
200MM PROBE STATION
Magic-A200e - Adaptive Engineering Probe Station
Magic-A200e adaptive engineering probe station provides reliable mesurement for 200mm wafer probing testing. The wafer probe station ensures reliable measurement for precision device characterization, wafer-level reliability and failure analysis, high-speed component wafer sort, etc.
300MM PROBE STATION
Magic-P300m - Precision Engineering Probe Station
Magic-P300m - Precision Engineering Probe Station
Magic-P300m - Precision Engineering Probe Station
Magic-P300m is an excellent tool providing extraordinary stepping accuracy across wide temperature range for device characterization, high power, RF measurement and wafer level reliability testing and failure analysis, etc.
Magic-P300e - Precision Engineering Probe Station
Magic-P300m - Precision Engineering Probe Station
Magic-P300m - Precision Engineering Probe Station
Magic-P300e is a high-performance engineering probe station to perform device characterization, wafer-level reliability qualification, SPICE modeling, or yield enhancement.
Magic-X300e - Engineering Automatic Probe Station
Magic-X300e - Engineering Automatic Probe Station
Magic-X300e - Engineering Automatic Probe Station
Magic-X300e is a semi-automatic probing station and performs DC to RF, microwave and electro-optical probing and superconducting magnetic measurement.
Magic-X300a - Engineering Automatic Probe Station
Magic-X300e - Engineering Automatic Probe Station
Magic-X300e - Engineering Automatic Probe Station
Magic-X300a is a fully automatic probing station for 300mm wafer level testing and performs DC to RF, microwave and electro-optical probing and superconducting magnetic measurements.
ADVANCED PROBE SYSTEM
Sagittarius-SPT - Silicon Photonics Test System
Unicorn-LAIT II - LED Advanced Integrated Tester
Unicorn-LAIT II - LED Advanced Integrated Tester
Sagittarius-SPT is an automatic Silicon Photonics (SiPh) wafer level test/probing system for characterization and acceptance test for optical and electrical devices.
Unicorn-LAIT II - LED Advanced Integrated Tester
Unicorn-LAIT II - LED Advanced Integrated Tester
Unicorn-LAIT II - LED Advanced Integrated Tester
Unicorn-LAIT II is a high throughput integrated test system for Mini-and Micro-LEDs based on a flexible architecture platform supporting small pads probing with controlled needle force.
ACCESSORIES
Capricorn-MP - Multi-Die Probe Positioner
Capricorn-MP - Multi-Die Probe Positioner
Capricorn-MP - Multi-Die Probe Positioner
STAr Capricorn MP Multi-Die Probe Positioner is a 6-axes (XYZ-aβθ) positioner that can hold a probe card of up to 26 probe pins for use with standard parametric tests or high temperature reliability tests.
Capricorn-MP - Multi-Die Probe Positioner
Capricorn-MP - Multi-Die Probe Positioner