SOLUTIONS > IC AUTOMATED TEST SOLUTIONS
STAr provides cost effective semiconductor ATE test systems for linear, power management and mixed signal devices and ensures industry customers attain the highest level of return-on-investments and satisfaction.
- MIXED SIGNAL ATE TESTER
- POWER DEVICE CHARACTERIZATION SOLUTION
MIXED SIGNAL ATE TESTER
Mercury M1 - Low Cost Mixed Signal ATE Tester
Mercury M2 - Multisite Mixed Signal ATE Tester
Mercury M2 - Multisite Mixed Signal ATE Tester
STAr Mercury M1 is cost-effective analog and mixed signal ATE for high volume testing of linear ICs, power management ICs, MEMs devices, light/imaging sensors, video/voice ICs, etc.
Mercury M2 - Multisite Mixed Signal ATE Tester
Mercury M2 - Multisite Mixed Signal ATE Tester
Mercury M2 - Multisite Mixed Signal ATE Tester
STAr Mercury M2 multisite analog and mixed signal automatic test equipment is high performance ATE for high volume testing of linear ICs, power management ICs, MEMs devices, light/imagingsensors, video/voice ICs, etc.
POWER DEVICE CHARACTERIZATION SOLUTION
Taurus-PDAT - Power Device Characterization Solution
STAr Taurus-PDAT tester is designed for both lab and production test of discrete MOSFET and IGBT devices. The system is targeted at high voltage and or high current discrete parts.
Features
•10 V – 1,500 V (Support 80% Vcc testing of 1700 V devices)
•5 A - 500 A (Switching tests)
•2000A max short circuit
•10000 A/µs & 400 V/ns measurement slew rates
•PMOS / NMOS / Depletion mode capable
•Gate Voltage VGS： -30 V, +30 V with separate RG(on) and RG(off)
•Over current DUT protection
•Characterization & Final test Models
•Selectable inductor box for switching tests
•Selectable inductor box for UIL tests
•Optional DUT thermal forcing capability