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www.STAr-Quest.com
  • 思達科技 | STAR TECHNOLOGIES
  • ABOUT US
    • COMPANY PROFILE
    • PHILOSOPHY
    • MILESTONE
    • MANAGEMENT
    • QUALITY POLICY
    • CSR POLICY
  • PRODUCTS
    • PARAMETRIC INSTRUMENT
    • RELIABILITY TEST SYSTEM
    • AUTOMATED TEST EQUIPMENT
    • YIELD ENHANCEMENT
    • METROLOGY TOOL
    • PARAMETRIC PROBE CARD
    • FUNCTIONAL PROBE CARD
    • VERTICAL PROBE CARD
    • MEMS PROBE CARD
    • CONDUCTIVE ELASTOMER
    • PROBE STATION
    • PROFESSIONAL SERVICE
  • SOLUTIONS
    • PARAMETRIC TEST
    • RELIABILITY TEST
    • IC AUTOMATED TEST
    • RF & WIRESLESS TEST
    • PHOTONICS &OPTRONIC TEST
    • POWER ELECRONICS TEST
    • FPD & LED TEST
  • NEWS & EVENTS
    • NEWS
    • - ARCHIEVE 2024
    • - ARCHIEVE 2023
    • - ARCHIEVE 2022
    • - ARCHIEVE 2021
    • EVENTS
  • CONTACT US
    • GROUP COMPANY
    • GLOBAL SALES NETWORK
  • PARTNERS
    • BUSINESS PARTNERS
    • SOLUTION PARTNERS
    • INDUSTRY PARTNERS

PRODUCTS > AUTOMATED TEST EQUIPMENT (ATE)

AUTOMATED TEST EQUIPMENT (ATE)

STAr partners with key industry leaders to deliver the highest ATE in a scalable, open architecture platform. With powerful software tools that aid the developer in the setup and control of test configurations, errors are absolutely minimized.

  • MIXED-SIGNAL TEST SYSTEM
  • POWER DEVICE TEST SYSTEM
  • HIGH-PARALLELISM PARAMETRIC TESTER
  • MODULAR AUTOMATIC TEST EQUIPMENT

MIXED-SIGNAL TEST SYSTEM

Mercury - Mixed Signal Automated Test Equipment

Mercury - Mixed Signal Automated Test Equipment

Mercury - Mixed Signal Automated Test Equipment

Mercury - Mixed Signal Automated Test Equipment

STAr Mercury series mixed signal test system is the most cost-effective high performance ATE with precision analog and digital instrumentations integrated into a test head built for DC, AC and mixed signal test.

Orion - Zero-Footprint Mixed Signal Test System

Mercury - Mixed Signal Automated Test Equipment

Mercury - Mixed Signal Automated Test Equipment

Orion - Zero-Footprint Mixed Signal Test System

STAr Orion Series is a zero-footprint mixed signal ATE with expandable “stack-on” instrument modules. The small footprint enables direct docking to DUT cards for handlers at final tests and to probe cards for probers at wafer sort.

POWER DEVICE TEST SYSTEM

Taurus-PDAT High Power Device Analytic Test System

Taurus-PDAT High Power Device Analytic Test System

STAr Taurus-PDAT tester is designed for both lab and production test of discrete MOSFET and IGBT devices. The system is targeted at high voltage and or high current discrete parts.

HIGH-PARALLELISM PARAMETRIC TESTER

Gemini – Parametric/Reliability Automated Test Equipment

STAr Gemini ATE application testing range includes advanced high-density package qualification, embedded components characterization, high power package dielectric breakdown tests and highly accuracy and precision IVR-OSL and DC current/voltage, etc.

MODULAR AUTOMATIC TEST EQUIPMENT

VTI - Data Acquisition and Signal Conditioning

VTI - Data Acquisition and Signal Conditioning

VTI - Data Acquisition and Signal Conditioning

VTI - Data Acquisition and Signal Conditioning

VIT’s modular, high-density VXI data acquisition and signal conditioning instruments are ideal for high channel count applications. Combining this platform with the LXI platform provides the bandwidth and horsepower needed to address today’s expanding data throughput requirements.

VTI - Signal and I/O Switching

VTI - Data Acquisition and Signal Conditioning

VTI - Data Acquisition and Signal Conditioning

VTI - Signal and I/O Switching

VTI's SMIP™ signal switching series revolutionized the automated signal switching marketplace by providing a level of modularity, density, and performance for the VXIbus platform that was unprecedented.

VTI - Microwave Interface and Switching

VTI - Data Acquisition and Signal Conditioning

VTI - Microwave Interface and Switching

VTI - Microwave Interface and Switching

VTI’s microwave interfaces and switches support industry customers during the specification and development phase of their microwave subsystems, while providing a streamlined process for automatically creating test system with life-long support.

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