products > METROLOGY TOOl
In semiconductor manufacturing, the performance of metrology tools directly impacts quality and yield. Partnering with key metrology equipment suppliers, STAr aims to provide solutions for advanced process controls, defect analysis and critical structural metrology measurements.
LASERTEC CONFOCAL SCANNING LASER MICROSCOPE
Lasertec Laser Microscope OPTELICS® HYBRID+
Lasertec Laser Microscope OPTELICS® HYBRID+
Lasertec Laser Microscope OPTELICS® HYBRID+
Lasertec Laser Microscope OPTELICS® HYBRID+ is sutible for industrial files such as semiconductor materials, MEMS, film, optical parts, thin film, organic/inorganic materials, etc.
Laser Microscope OPTELICS® HYBRID
Lasertec Laser Microscope OPTELICS® HYBRID+
Lasertec Laser Microscope OPTELICS® HYBRID+
Laser Microscope OPTELICS® HYBRID observation and measurement of various samples including semiconductor materials and devices, transparent films, ITO films, MEMS, coating materials and films, inorganic and organic materials, biological samples, metal parts, and plastic parts.
OPTICAL INSPECTION/MEASUREMENT MICROSCOPE
OPTICAL INSPECTION/MEASUREMENT MICROSCOPE
OPTICAL INSPECTION/MEASUREMENT MICROSCOPE
STAr partners with various suppliers in the development, sales, service and support of optical inspection and measurement microscope. The optical microscope (light microscope) uses visible light and a system of lenses to magnify images of small samples. Digital microscopes use advanced CCD and optics to enable wide range zooming with auto-focusing.
PCI - PROBE CARD INTERFACE
OPTICAL INSPECTION/MEASUREMENT MICROSCOPE
OPTICAL INSPECTION/MEASUREMENT MICROSCOPE
STAr has exclusive license from Onto to design, manufacture and qualify PCI’s for different ATE test platforms so as to produce PCIs that will provide precise and consistent test result. STAr also delivered PCIs for the PrecisionPoint (PRVX) series of probe card analyzers that best emulate the prober/tester work cell environment for customers.