2017-10-31~2017-11-02
 
48th International Test Conference (ITC)  
 

 

Fort Worth Convention Center, Forth Worth TX, USA

October 31, 2017 – November 2, 2017

International Test Conference (ITC) is the world’s premier conference dedicated to the testing and design-for-testability of integrated circuits, allied components, assemblies and systems. Exhibits of test equipment, design and test software, ancillary equipment and services greatly enhance the overall conference, attracting a multitude of industry professionals from throughout the world. 

For more details regarding to the annual event, please refer to webpage http://www.itctestweek.org/program/.


STAr Technologies Presents Power Device Test Solution

At 2017 ITC, STAr will present test solutions of power device qualification and mixed Analogue/Mixed-signal automated test equipment. For more product information, please make a reservation with us at marketing@star-quest.com. We look forward to seeing your at this great event. 

 
 

 

 

 

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