2017 IEEE International Reliability Physics Symposium (IRPS)  




April 2-6, 2017

Hyatt Regency

Monterey, CA USA

For 54 years, IRPS has been the premiere conference for engineers and scientists to present new and original work in the area of microelectronics reliability. Drawing participants from the United States, Europe, Asia, and all other parts of the world, IRPS seeks to understand the reliability of semiconductor devices, integrated circuits, and microelectronic assemblies through an improved understanding of both the physics of failure as well as the application environment.

IRPS provides numerous opportunities for attendees to increase their knowledge and understanding of all aspects of microelectronics reliability. It is also an outstanding chance to meet and network with reliability colleagues from around the world.

STAr Technologies Showcases
Wafer Level Reliability Products and Test Solutions at IRPS 2017 

At IRPS 2017, STAr will present wafer level reliability product and test solutions such as WLR/PLR test systems, analysis software and reliability test probe cards. Please make a reservation with us at marketing@star-quest.com. We look forward to meeting you at this great annual event.






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